M. Schulz, T. Wagner, P. Lehmann Fiber-coupled interferometric sensor for high-speed measurement of optical surfaces Optimess 2015, 6thInternational Conference on Optical Measurement Techniques for Structures & Systems (2015)
S. Tereschenko, P. Lehmann, P. Gollor, P. Kühnhold Robust vertical scanning white-light interferometry in close-to-machine applications SPIE Proceedings 9525, Optical Measurement Systems for Industrial Inspection IX (2015) 95250Q
P. Kühnhold, A. Nolvi, S. Tereschenko, I. Kassamakov, E. Hæggström, P. Lehmann Transparent layer thickness measurement using low-coherence interference microscopy SPIE Proceedings 9525, Optical Measurement Systems for Industrial Inspection IX (2015) 95252F
S. Laubach, G. Ehret, H. Knell, P. Kühnhold, P. Lehmann Calibration strategies for a new fast line-based form measuring system DGaO Proceedings 2015
M. Schake, P. Lehmann Erweiterung des Eindeutigkeitsbereichs eines fasergekoppelten Zwei-Wellenlängen-Interferometers XXIX. Messtechnisches Symposium, Ilmenau, Sept. 2015
P. Lehmann, W. Xie Signal formation in depth-scanning 3D interference microscopy at high numerical apertures SPIE Proceedings 9660, Speckle 2015 (2015) 966015
Fachzeitschriften
M. Schake, M. Schulz, P. Lehmann High-resolution fiber-coupled interferometric point sensor for micro- and nano-metrology tm – Technisches Messen 82, Nr. 7-8 (2015) 367-376
Patente
P. Lehmann, M. Schulz Vorrichtung und Verfahren zur interferometrischen Abstandsbestimmung Patentschrift DE 10 2014 108 886 B3 (26.11.2015)
