Radiographic Fine Structure
In the "X-ray fine structure analysis" focus area, we offer exciting thesis topics in the field of structural characterization of crystalline materials using modern X-ray diffraction analysis. A particular focus is on the determination of lattice parameters, crystal orientations and texture or phase fractions and residual stress distributions, which are influenced by heat treatment or mechanical processing, for example. In addition, advanced methods such as Rietveld analysis are used to precisely determine complex phase compositions. The embedding of autonomous and computer-aided systems for active experiment control has also been introduced, which forms the basis for the application of AI systems. Depending on the task at hand, the radiographic examinations are supplemented by additional methods such as SEM analyses or hardness tests in order to obtain a comprehensive picture of the microstructure and its influence on the material properties.
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Current research projects:
GlobalAM - Enabling laser powder bed fusion for high precision mass production of multi-material components on dissimilar substrate materials
Analysis and evaluation of the effects of residual stresses on damage progression in intrinsically manufactured plastic-metal layered composites under static and cyclic load
Influence of residual stresses on crack propagation behavior in microstructurally graded samples produced via laser-based additive manufacturing