Spectroscopic Ellipsometer - FB10

The spectroscopic ellipsometer is used to determine layer thicknesses and refractive indices. Wavelengths from 190 nm - 2400 nm can be used for measurement.

Manufacturer: J. A. Woollam

M. Sc. Lukas Wolfram (PhD Student)

Telephone: +49 561 804-4745
Email: lukas.wolfram[at]uni-kassel[dot]de

Website: Wrinkled Amorphous Films