Nanosensorics (FB16-2285)

Nanosensorics (FB16-2285)

(Prof. Dr. Thomas Kusserow)


The lecture is given in English language.


The Lecture at Moodle (Link)

Covered Topics:

Fundamentals of Nanosensorics


Optical Microscopy

  • Resolution Limits
  • Contrasting Techniques
  • Scanning Confocal Microscopy
  • STED and 4pi Microscopy


Electron and Ion Beam Microscopy

  • SEM
  • TEM
  • FIB
  • Ion Beam Microscopes

Scanning Probe Microscopy

  • AFM
  • STM
  • SNOM

Semiconductor Analytics

  • XRD
  • PL
  • Raman Spectroscopy
  • Laser Gain


  • Null Ellipsometer
  • Spectral Ellipsometry
  • Parameter Modelling

Literature List:

Bhushan (Ed.):Springer Handbook of Nanotechnology, Springer Verlag
Träger (Ed.): Springer Handbook of Lasers and Optics, Springer Verlag
Lawes: Scanning electron microscopy and X-ray microanalysis, Wiley
Reimer: Scanning electron microscopy, Springer Verlag
Goldstein: Scanning electron microscopy and x-ray microanalysis, Kluwer Academic
Brent: Transmission electron microscopy and diffractometry of materials, Springer Verlag
Reimer: Transmission electron microscopy, Springer Verlag
Giannuzzi: Introduction to Focused Ion Beams, Springer Verlag
Dror: Scanning force microscopy, Oxford University Press
Wiesendanger: Scanning probe microscopy, Springer Verlag
Stroscio: Scanning tunneling microscopy, Academic Press
Bai: Scanning tunneling microscopy and its applications, Springer Verlag
Paesler: Near field optics, Wiley
Fillard: Near field optics and nanoscopy, World Scientific
Kittel: Introduction to solid state physics, wiley
Ibach: Solid-state physics, Springer Verlag
Ashcroft: Solid state physics, Brooks/Cole
Bauer: Optical characterization of epitaxial semiconductor layers, Springer Verlag
Schroder: Semiconductor material and device characterization, Wiley
Tompkins (Ed.): Handbook of ellipsometry, W.Andrew Pub./Springer
Azzam: Ellipsometry and polarized light, North-Holland

Nanosensorics Lab

The schedule of the nanosensorics lab and the related laser safety instructions seminar will be given during the lecture.