Publications

2023[ to top ]
  • Meier, D., Ragunathan, R., Degener, S., Liehr, A., Vollmer, M., Niendorf, T., Sick, B.: Reconstruction of incomplete X-ray diffraction pole figures of oligocrystalline materials using deep learning Scientific Reports. 13, 5410 (2023). https://doi.org/10.1038/s41598-023-31580-1.
2022[ to top ]
  • Meier, D., Ramirez, L.V., Völker, J., Viefhaus, J., Sick, B., Hartmann, G.: Optimizing a superconducting radio-frequency gun using deep reinforcement learning Physical Review Accelerators and Beams. 25, 104604 (2022). https://doi.org/10.1103/PhysRevAccelBeams.25.104604.
  • Dingel, K., Otto, T., Marder, L., Funke, L., Held, A., Savio, S., Hans, A., Hartmann, G., Meier, D., Viefhaus, J., Sick, B., Ehresmann, A., Ilchen, M., Helml, W.: Artificial intelligence for online characterization of ultrashort X‑ray free‑electron laser pulses Scientific Reports. 12, 1–14 (2022). https://doi.org/10.1038/s41598-022-21646-x.
2021[ to top ]
  • Dingel, K., Otto, T., Marder, L., Funke, L., Held, A., Savio, S., Hans, A., Hartmann, G., Meier, D., Viefhaus, J., Sick, B., Ehresmann, A., Ilchen, M., Helml, W.: Toward AI-enhanced online-characterization and shaping of ultrashort X-ray free-electron laser pulses arXiv e-prints. arXiv:2108.13979 (2021).
  • Dingel, K., Liehr, A., Vogel, M., Degener, S., Meier, D., Niendorf, T., Ehresmann, A., Sick, B.: AI - Based On The Fly Design of Experiments in Physics and Engineering In: Workshop on Self-Improving System Integration (SISSY), ACSOS. bll 150–153. IEEE (2021). https://doi.org/10.1109/ACSOS-C52956.2021.00048.
2020[ to top ]
  • Meier, D., Hartmann, G., Völker, J., Viefhaus, J., Sick, B.: Reconstruction of offsets of an electron gun using deep learning and an optimization algorithm In: Advances in Computational Methods for X-Ray Optics V. bll 71–77. SPIE (2020). https://doi.org/10.1117/12.2568001.
2016[ to top ]
  • Tomforde, S., Meier, D., Stein, A., von Mammen, S.: Distributed Resource Allocation as Co-Evolution Problem In: IEEE Congress on Evolutionary Computation (CEC). bll 1815–1822. IEEE, Vancouver, BC, Canada (2016). https://doi.org/10.1109/cec.2016.7744009.