Publications 2019
Conference Proceedings
- J. Riebeling, I. Wellem, G. Ehret, P. Lehmann
Detection of form deviations of rotating optical surfaces with line-scanning interferometer, real-timeevaluation and compensation of scan axis deviations
tm - Technisches Messen, 86 S1 (2019) 92-96
- M. Schake, P. Lehmann
Double pulse LED illumination for phase detection in RGB-interferometry
SPIE Proceedings 11056 (2019) 110560T
- J. Riebeling, G. Ehret, P. Lehmann
Optical form measurement system using a line-scan interferometer and distance measuring interferometers for run-out compensation of the rotational object stage
SPIE Proceedings 11056 (2019) 110562D
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- S. Hagemeier, P. Lehmann
High resolution topography sensors in a multisenor measuring setup
SPIE Proceedings 11056 (2019) 110563I
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Journals
- P. Lehmann, S. Tereschenko, P. Gollor, M. Schake, S. Hagemeier
In-Prozess Messung von 3D-Oberflächentopographien mit interferometrischen Verfahren
Jahresmagazin Mess- und Sensortechnik (2019/2020) 44-49
- S. Tereschenko, P. Lehmann
Inline scanning white-light interferometry with integrated vibration compensation
tm - Technisches Messen, 86 (2019) 197-207
- S. Hagemeier, S. Tereschenko, P. Lehmann
High-speed laser interferometric distance sensor with reference mirror oscillating at ultrasonic frequencies
tm - Technisches Messen, 86 (2019) 164-174
- S. Hagemeier, M. Schake, P. Lehmann
Sensor characterization by comparative measurements using a multi-sensor measuring system
J. Sens. Sens. Syst., 8 (2019) 111-121
- M. Schake, P. Lehmann
Quadrature-based interferometry using pulsed RGB illumination
Optics Express 27, No. 11 (2019) 16343-16358
- S. Tereschenko, Marcel Dissemond, Kevin Weinke, P. Lehmann
Temporal high-resolution evaluation algorithm for sinusoidally phase modulated interference signals
Optics Express 27, No. 10 (2019) 14767-14783
- P. Lehmann, S. Tereschenko, B. Allendorf, S. Hagemeier, L. Hüser
Spectral composition of low-coherence interferograms at high numerical apertures
JEOS-RP (2019) 15:5
- B. Allendorf, E. Käkel, U.-M. Ha, S. Hagemeier, H. Hillmer, P. Lehmann
Adaptive high-resolution Linnik interferometry for 3D measurement of microparticles
Optics Letters 44 (2019) 3550-3553